PELCO X-Checker SEM calibration x-ray wafer references loupes black anodised aluminium and silicon
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PELCO X-Checker SEM calibration x-ray wafer references loupes black anodised aluminium and siliconThe PELCO X Checker Wafer is available for systems set up for silicon wafer handling. The PELCO X Checker Wafer is available on standard 200mm and 300mm wafers, with eight standards for elemental and spatial calibrations. References includes: Copper disc to check spectral calibration Manganese 88%, nickel 12% alloy to measure full width at half max (FWHM) detector resolution Nickel 400 mesh TEM grid for imaging calibration PTFE as a fluorine source to
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